MPSD Seminar

16936 1543930707

New Methods of Measuring Material Structure Using X-Ray Diffraction Data

  • Datum: 06.12.2018
  • Uhrzeit: 15:00 - 16:00
  • Vortragender: Edward Rowe
  • University of Oxford, Dept. of Physics
  • Ort: CFEL (Bldg. 99)
  • Raum: Seminar Room V, O1.109
  • Gastgeber: Andrea Cavalleri
In this talk I will discuss how the classical theory of x-ray diffraction can be used to simulate the intensity pattern produced by a powdered sample, generalised to the case where the finite size of the crystallites in the sample is accounted for. I will then explain how we are using this theory to develop new methods of measuring the shape and size of crystallites in a fractured crystal sample from x-ray diffraction data.
 
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