New Methods of Measuring Material Structure Using X-Ray Diffraction Data

MPSD Seminar

  • Date: Dec 6, 2018
  • Time: 03:00 PM - 04:00 PM (Local Time Germany)
  • Speaker: Edward Rowe
  • University of Oxford, Dept. of Physics
  • Location: CFEL (Bldg. 99)
  • Room: Seminar Room V, O1.109
  • Host: Andrea Cavalleri
In this talk I will discuss how the classical theory of x-ray diffraction can be used to simulate the intensity pattern produced by a powdered sample, generalised to the case where the finite size of the crystallites in the sample is accounted for. I will then explain how we are using this theory to develop new methods of measuring the shape and size of crystallites in a fractured crystal sample from x-ray diffraction data.
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