Vortragender: Lena F. Kourkoutis Ort: CFEL (Bldg. 99)
Spectroscopic mapping by STEM/EELS has proven to be a powerful technique for determining the structure, chemistry and bonding of interfaces, reconstructions, and defects. So far, most efforts in the physical sciences have focused on room temperature measurements where atomic resolution mapping of composition and bonding has been demonstrated [1-3]. For many materials, including those that exhibit electronic and structural phase transitions below room temperature and systems that involve liquid/solid interfaces, STEM/EELS measurements at low temperature are required. Operating close to liquid nitrogen temperature gives access to a range of emergent electronic states in solid materials and allows us to study processes at liquid/solid interfaces immobilized by rapid freezing [4,5]. [mehr]
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