MPSD Seminar

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New Methods of Measuring Material Structure Using X-Ray Diffraction Data

In this talk I will discuss how the classical theory of x-ray diffraction can be used to simulate the intensity pattern produced by a powdered sample, generalised to the case where the finite size of the crystallites in the sample is accounted for. I will then explain how we are using this theory to develop new methods of measuring the shape and size of crystallites in a fractured crystal sample from x-ray diffraction data. [mehr]

 
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