New Methods of Measuring Material Structure Using X-Ray Diffraction Data
15:00 - 16:00
University of Oxford, Dept. of Physics
CFEL (Bldg. 99)
Seminar Room V, O1.109
In this talk I will discuss how the classical theory of x-ray diffraction can be used to simulate the intensity pattern produced by a powdered sample, generalised to the case where the finite size of the crystallites in the sample is accounted for. I will then explain how we are using this theory to develop new methods of measuring the shape and size of crystallites in a fractured crystal sample from x-ray diffraction data.